Browsing by Subject "scanning probe microscopy"

Browsing by Subject "scanning probe microscopy"

Sort by: Order: Results:

  • Schmidt, Hennrik; Rode, Johannes C.; Smirnov, Dmitri; Haug, Rolf J. (London : Nature Publishing Group, 2014)
    The electronic properties of bilayer graphene strongly depend on relative orientation of the two atomic lattices. Whereas Bernal-stacked graphene is most commonly studied, a rotational mismatch between layers opens up a ...