Dorozhkin, S.I.; Smet, J.H.; von Klitzing, K.; Umansky, V.; Haug, Rolf J.; Ploog, K.
(College Park, MD : American Physical Society, 2001)
We have studied the capacitance between a two-dimensional electron system and a gate of field-effect transistors, produced from three different wafers with a single remotely doped GaAs/AlxGa1-xAs heterojunction. In the ...