Browsing Fakultät für Elektrotechnik und Informatik by Subject "X-ray ionization"

Browsing Fakultät für Elektrotechnik und Informatik by Subject "X-ray ionization"

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  • Bunert, Erik; Reinecke, Tobias; Kirk, Ansgar T.; Bohnhorst, Alexander; Zimmermann, Stefan (Amsterdam : Elsevier, 2018)
    Ion mobility spectrometers (IMS) are compact devices for extremely sensitive detection of proton and electron affine volatile compounds down to low pptv concentrations within less than a second. The measuring principle ...

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