dc.identifier.uri |
http://dx.doi.org/10.15488/3359 |
|
dc.identifier.uri |
http://www.repo.uni-hannover.de/handle/123456789/3389 |
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dc.contributor.author |
Steinecke, M.
|
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dc.contributor.author |
Jupé, M.
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dc.contributor.author |
Kiedrowski, K.
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dc.contributor.author |
Ristau, D.
|
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dc.contributor.editor |
Exarhos, Gregory J.
|
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dc.contributor.editor |
Gruzdev, Vitaly E.
|
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dc.contributor.editor |
Menapace, Joseph A.
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dc.contributor.editor |
Ristau, Detlev
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dc.contributor.editor |
Soileau, M.J.
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dc.date.accessioned |
2018-05-23T07:46:34Z |
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dc.date.available |
2018-05-23T07:46:34Z |
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dc.date.issued |
2017 |
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dc.identifier.citation |
Steinecke, M.; Jupé, M.; Kiedrowski, K.; Ristau, D.: Measurement of the nonlinear refractive index in optical thin films. In: Proceedings of SPIE 10447 (2017), 104472A. DOI: https://doi.org/10.1117/12.2281127 |
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dc.description.abstract |
Based on the z-scan method, an interferometric set-up for measuring the optical Kerr-effect was engineered and optimized. Utilizing a Mach-Zehnder configuration, the wave front deformation caused by the Kerr induced selffocusing is monitored. Fitting this deformation to a theoretical approach basing on a beam propagation model, the nonlinear refractive index is obtained. The procedure can be applied to measure the nonlinear refractive index of both, the substrate material as well as the deposited dielectric layer on top of the substrate. The nonlinear refractive index of a layer specially deposited for this purpose as well as for several substrate materials was measured and the results presented. © 2017 SPIE. |
eng |
dc.language.iso |
eng |
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dc.publisher |
Bellingham, WA : S P I E - International Society for Optical Engineering |
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dc.relation.ispartof |
Medical Imaging 2017: Image-Guided Procedures, Robotic Interventions, and Modeling : 14-16 February 2017, Orlando, Florida, United States |
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dc.relation.ispartofseries |
Proceedings of SPIE 10447 (2017) |
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dc.rights |
Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. Dieser Beitrag ist aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich. |
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dc.subject |
Kerr-effect |
eng |
dc.subject |
nonlinear optics |
eng |
dc.subject |
self-focusing |
eng |
dc.subject |
thin films |
eng |
dc.subject |
Deformation |
eng |
dc.subject |
Laser damage |
eng |
dc.subject |
Nonlinear optics |
eng |
dc.subject |
Optical materials |
eng |
dc.subject |
Refractive index |
eng |
dc.subject |
Thin films |
eng |
dc.subject |
Wavefronts |
eng |
dc.subject |
Dielectric layer |
eng |
dc.subject |
Nonlinear refractive index |
eng |
dc.subject |
Optical thin films |
eng |
dc.subject |
Propagation modeling |
eng |
dc.subject |
Self-focusing |
eng |
dc.subject |
Substrate material |
eng |
dc.subject |
Theoretical approach |
eng |
dc.subject |
Z-scan method |
eng |
dc.subject |
Optical Kerr effect |
eng |
dc.subject.classification |
Konferenzschrift |
ger |
dc.subject.ddc |
620 | Ingenieurwissenschaften und Maschinenbau
|
ger |
dc.title |
Measurement of the nonlinear refractive index in optical thin films |
eng |
dc.type |
BookPart |
|
dc.type |
Text |
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dc.relation.essn |
1996-756X |
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dc.relation.isbn |
978-1-5106-1363-8 |
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dc.relation.issn |
0277-786X |
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dc.relation.doi |
https://doi.org/10.1117/12.2281127 |
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dc.bibliographicCitation.volume |
10447 |
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dc.bibliographicCitation.firstPage |
104472A |
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dc.description.version |
publishedVersion |
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tib.accessRights |
frei zug�nglich |
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