Precision measurement of the metastable 3P2 lifetime of neon

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dc.identifier.uri http://dx.doi.org/10.15488/3267
dc.identifier.uri http://www.repo.uni-hannover.de/handle/123456789/3297
dc.contributor.author Zinner, Martin
dc.contributor.author Spoden, Peter
dc.contributor.author Kraemer, Tobias
dc.contributor.author Birkl, Gerhard
dc.contributor.author Ertmer, Wolfgang
dc.date.accessioned 2018-05-09T11:40:24Z
dc.date.available 2018-05-09T11:40:24Z
dc.date.issued 2003
dc.identifier.citation Zinner, M.; Spoden, P.; Kraemer, T.; Birkl, G.; Ertmer, W.: Precision measurement of the metastable 3P2 lifetime of neon. In: Physical Review A 67 (2003), Nr. 1, 4. DOI: https://doi.org/10.1103/PhysRevA.67.010501
dc.description.abstract The lifetime of the metastable 3P2 state of neon has been determined as 14.73(14)s [decay rate 0.06790(64)s−1] by measuring the decay in fluorescence of an ensemble of 20Ne atoms trapped in a magneto-optical trap (MOT). Due to low background gas pressure (p<5×10−11mbar) and low relative excitation to the 3D3 state (0.5 % excitation probability) only small corrections have to be included in the lifetime extrapolation. Together with a careful analysis of residual loss mechanisms in the MOT a lifetime determination to high precision is achieved. eng
dc.language.iso eng
dc.publisher American Physical Society
dc.relation.ispartofseries Physical Review A 67 (2003), Nr. 1
dc.rights Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden.
dc.subject magneto-optical trap eng
dc.subject MOT eng
dc.subject neon eng
dc.subject.ddc 530 | Physik ger
dc.title Precision measurement of the metastable 3P2 lifetime of neon
dc.type Article
dc.type Text
dc.relation.issn 1050-2947
dc.relation.doi https://doi.org/10.1103/PhysRevA.67.010501
dc.bibliographicCitation.issue 1
dc.bibliographicCitation.volume 67
dc.bibliographicCitation.firstPage 4
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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