dc.identifier.uri |
http://dx.doi.org/10.15488/2831 |
|
dc.identifier.uri |
http://www.repo.uni-hannover.de/handle/123456789/2857 |
|
dc.contributor.author |
Rogge, M.C.
|
|
dc.contributor.author |
Fühner, C.
|
|
dc.contributor.author |
Keyser, U.F.
|
|
dc.contributor.author |
Haug, Rolf J.
|
|
dc.contributor.author |
Bichler, M.
|
|
dc.contributor.author |
Abstreiter, G.
|
|
dc.contributor.author |
Wegscheider, W.
|
|
dc.date.accessioned |
2018-02-23T10:08:38Z |
|
dc.date.available |
2018-02-23T10:08:38Z |
|
dc.date.issued |
2003 |
|
dc.identifier.citation |
Rogge, M.C.; Fühner, C.; Keyser, U.F.; Haug, R.J.; Bichler, M. et al.: Combined atomic force microscope and electron-beam lithography used for the fabrication of variable-coupling quantum dots. In: Applied Physics Letters 83 (2003), Nr. 6, S. 1163-1165. DOI: https://doi.org/10.1063/1.1599972 |
|
dc.description.abstract |
A study was performed on combined electron-beam lithography and atomic force microscopy used for the fabrication of variable-coupling quantum dots. The conventional electron-beam lithography was combined with direct nanofabrication by local anodic oxidation to produce a parallel double quantum dot based on a GaAs/AlGaAs heterostructure. It was found that the combination of both nanolithography methods allowed fabrication of robust in-plane gates. |
eng |
dc.language.iso |
eng |
|
dc.publisher |
College Park, MD : American Institute of Physics |
|
dc.relation.ispartofseries |
Applied Physics Letters 83 (2003), Nr. 6 |
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dc.rights |
Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. |
|
dc.subject |
Anodic oxidation |
eng |
dc.subject |
Atomic force microscopy |
eng |
dc.subject |
Electron beam lithography |
eng |
dc.subject |
Heterojunctions |
eng |
dc.subject |
Nanotechnology |
eng |
dc.subject |
Interdot coupling |
eng |
dc.subject |
Semiconductor quantum dots |
eng |
dc.subject.ddc |
530 | Physik
|
ger |
dc.title |
Combined atomic force microscope and electron-beam lithography used for the fabrication of variable-coupling quantum dots |
eng |
dc.type |
Article |
|
dc.type |
Text |
|
dc.relation.issn |
00036951 |
|
dc.relation.doi |
https://doi.org/10.1063/1.1599972 |
|
dc.bibliographicCitation.issue |
6 |
|
dc.bibliographicCitation.volume |
83 |
|
dc.bibliographicCitation.firstPage |
1163 |
|
dc.bibliographicCitation.lastPage |
1165 |
|
dc.description.version |
publishedVersion |
|
tib.accessRights |
frei zug�nglich |
|