Numerical computation of magnetic fields applied to magnetic force microscopy

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dc.identifier.uri http://dx.doi.org/10.15488/2741
dc.identifier.uri http://www.repo.uni-hannover.de/handle/123456789/2767
dc.contributor.author Preisner, Thomas
dc.contributor.author Greiff, Michael
dc.contributor.author Bala, Uzzal Binit
dc.contributor.author Mathis, Wolfgang
dc.date.accessioned 2018-02-09T09:51:30Z
dc.date.available 2018-02-09T09:51:30Z
dc.date.issued 2009
dc.identifier.citation Preisner, T.; Greiff, M.; Bala, U.B.; Mathis, W.: Numerical computation of magnetic fields applied to magnetic force microscopy. In: COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1, S. 120-129. DOI: https://doi.org/10.1108/03321640910918922
dc.description.abstract Purpose - The purpose of this paper is to introduce a method which allows the calculation of the interactions of tip and sample of a magnetic force microscope as a first step to increase the accuracy of this technique. Design/methodology/approach - The emerging magnetic interactions between the cantilever tip and an arbitrary magnetized sample can be evaluated by the use of several numerical methods. For modelling this magnetically and mechanically coupled multiscale problem the finite element method is implemented. Findings - The evaluated magnetic fields interact in such a manner that a constructive overlap at the tip apex occurs. This leads to attractive forces acting on the cantilever. Research limitations/implications - In order to include the magneto-mechanical coupling, the implementation of a detailed force calculation is necessary. Furthermore, a hysteresis model is not yet considered. Practical implications - Magnetic force microscopy is a very sensitive technique. For instance, ideally the end of the tip consists of only one atom, but this is not realizable. Measurement errors cannot be avoided. This approach is the first step in developing an opportunity to soften them. Originality/value - One opportunity to verify real-time magnetic force microscope measurements is the comparison with theoretical considerations and calculations of the occurring magnetic distribution by using this technique. For this reason this paper deals with a new micromagnetic model to simulate the interactions between tip and sample of a scanning process of a magnetic force microscope. © Emerald Group Publishing Limited. eng
dc.language.iso eng
dc.publisher Bingley : Emerald Group Publishing Ltd.
dc.relation.ispartofseries COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1
dc.rights Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. Dieser Beitrag ist aufgrund einer (DFG-geförderten) Allianz- bzw. Nationallizenz frei zugänglich.
dc.subject Electromagnetism eng
dc.subject Finite element analysis eng
dc.subject Microscopes eng
dc.subject Nanotechnology eng
dc.subject Atomic force microscopy eng
dc.subject Coupled circuits eng
dc.subject Hysteresis eng
dc.subject Magnetic fields eng
dc.subject Magnetic force microscopy eng
dc.subject Magnetic materials eng
dc.subject Magnetic recording eng
dc.subject Magnetism eng
dc.subject Measurement errors eng
dc.subject Microscopes eng
dc.subject Nanocantilevers eng
dc.subject Nanotechnology eng
dc.subject Numerical methods eng
dc.subject Attractive forces eng
dc.subject Cantilever tips eng
dc.subject Design/methodology/approach eng
dc.subject Electromagnetism eng
dc.subject Finite element analysis eng
dc.subject Finite elements eng
dc.subject Force calculations eng
dc.subject Hysteresis models eng
dc.subject Magnetic distributions eng
dc.subject Magnetic force microscopes eng
dc.subject Magnetic forces eng
dc.subject Magnetic interactions eng
dc.subject Magneto-mechanical couplings eng
dc.subject Micromagnetic models eng
dc.subject Multi-scale problems eng
dc.subject Numerical computations eng
dc.subject Sensitive techniques eng
dc.subject Tip apices eng
dc.subject Finite element method eng
dc.subject.ddc 620 | Ingenieurwissenschaften und Maschinenbau ger
dc.subject.ddc 510 | Mathematik ger
dc.title Numerical computation of magnetic fields applied to magnetic force microscopy
dc.type Article
dc.type Text
dc.relation.issn 0332-1649
dc.relation.doi https://doi.org/10.1108/03321640910918922
dc.bibliographicCitation.issue 1
dc.bibliographicCitation.volume 28
dc.bibliographicCitation.firstPage 120
dc.bibliographicCitation.lastPage 129
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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