dc.identifier.uri |
http://dx.doi.org/10.15488/2543 |
|
dc.identifier.uri |
http://www.repo.uni-hannover.de/handle/123456789/2569 |
|
dc.contributor.author |
Schinke, Carsten
|
|
dc.contributor.author |
Bothe, Karsten
|
|
dc.contributor.author |
Peest, Peter Christian
|
|
dc.contributor.author |
Schmidt, Jan
|
|
dc.contributor.author |
Brendel, Rolf
|
|
dc.date.accessioned |
2017-12-12T12:31:42Z |
|
dc.date.available |
2017-12-12T12:31:42Z |
|
dc.date.issued |
2014 |
|
dc.identifier.citation |
Schinke, C.; Bothe, K.; Peest, P.C.; Schmidt, J.; Brendel, R.: Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths. In: Applied Physics Letters 104 (2014), Nr. 8, 81915. DOI: https://doi.org/10.1063/1.4866916 |
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dc.description.abstract |
We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results. © 2014 AIP Publishing LLC. |
eng |
dc.language.iso |
eng |
|
dc.publisher |
College Park, MD : American Institute of Physics |
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dc.relation.ispartofseries |
Applied Physics Letters 104 (2014), Nr. 8 |
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dc.rights |
Es gilt deutsches Urheberrecht. Das Dokument darf zum eigenen Gebrauch kostenfrei genutzt, aber nicht im Internet bereitgestellt oder an Außenstehende weitergegeben werden. |
|
dc.subject |
Physical properties |
eng |
dc.subject |
Physics |
eng |
dc.subject |
Crystalline silicons |
eng |
dc.subject |
Measurement uncertainty analysis |
eng |
dc.subject |
Near-infrared wavelength |
eng |
dc.subject |
Photoluminescence measurements |
eng |
dc.subject |
Relative uncertainty |
eng |
dc.subject |
Spectral response measurements |
eng |
dc.subject |
Wavelength ranges |
eng |
dc.subject |
Uncertainty analysis |
eng |
dc.subject.ddc |
530 | Physik
|
ger |
dc.title |
Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths |
eng |
dc.type |
Article |
|
dc.type |
Text |
|
dc.relation.issn |
00036951 |
|
dc.relation.doi |
https://doi.org/10.1063/1.4866916 |
|
dc.bibliographicCitation.issue |
8 |
|
dc.bibliographicCitation.volume |
104 |
|
dc.bibliographicCitation.firstPage |
81915 |
|
dc.description.version |
publishedVersion |
|
tib.accessRights |
frei zug�nglich |
|