Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals

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dc.identifier.uri http://dx.doi.org/10.15488/1941
dc.identifier.uri http://www.repo.uni-hannover.de/handle/123456789/1966
dc.contributor.author Briest, Niklas
dc.contributor.author Hamann, David
dc.contributor.author Garbe, Heyno
dc.contributor.author Potthast, Stefan
dc.date.accessioned 2017-09-22T11:47:56Z
dc.date.available 2017-09-22T11:47:56Z
dc.date.issued 2017
dc.identifier.citation Briest, N.; Hamann, D.; Garbe, H.; Potthast, S.: Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals. In: IEEE Transactions on Electromagnetic Compatibility 59 (2017), Nr. 4, S. 1276-1284. DOI: https://doi.org/10.1109/TEMC.2017.2666880
dc.description.abstract Transverse electromagnetic (TEM) waveguides are predominantly used for emission and immunity tests. General requirements for TEM waveguides are given by the IEC 61000-4-20. Annex C of the IEC 61000-4-20 specifies immunity tests based on high-altitude electromagnetic pulses with a double exponential waveform. This waveform's shape is sufficiently defined by the rise time and the pulsewidth. The quality of its transmission within a waveguide can, thus, be expressed by the allowed variation of these parameters. However, other arbitrary signals cannot be reduced to just these characteristic parameters. In this paper, a method is described that offers the possibility to characterize the transmission quality of a TEM cell for arbitrary transient waveforms. It is based on the Pearson correlation coefficient of a so-called reference signal and the signals being measured within the test volume of a TEM cell. Both signals are measured simultaneously with identical field probes in order to be independent from the reproducibility of the signal generator. The signals are windowed and limited to include only the defining reflections and distortions. By means of this signal-dedicated validation procedure, the transmission quality of a TEM waveguide can be validated for an arbitrary transient waveform. eng
dc.language.iso eng
dc.publisher Piscataway, NJ : Institute of Electrical and Electronics Engineers Inc.
dc.relation.ispartofseries IEEE Transactions on Electromagnetic Compatibility 59 (2017), Nr. 4
dc.rights CC BY 3.0 Unported
dc.rights.uri https://creativecommons.org/licenses/by/3.0
dc.subject Correlation methods eng
dc.subject Electromagnetic pulse eng
dc.subject Arbitrary signals eng
dc.subject Double exponential eng
dc.subject High-altitude electromagnetic pulse eng
dc.subject Pearson correlation coefficients eng
dc.subject Reference signals eng
dc.subject Reproducibilities eng
dc.subject Transmission quality eng
dc.subject Transverse electromagnetic eng
dc.subject Waveguides eng
dc.subject High-altitude electromagnetic pulses (HEMP) eng
dc.subject intentional electromagnetic interference (IEMI) eng
dc.subject signal dedicated verification (SiDeV) eng
dc.subject transients eng
dc.subject transverse electromagnetic (TEM) waveguide validation eng
dc.subject.ddc 670 | Industrielle und handwerkliche Fertigung ger
dc.subject.ddc 530 | Physik ger
dc.title Extension of the IEC 61000-4-20 Annex C to the Use of Arbitrary Transient Signals
dc.type Article
dc.type Text
dc.relation.issn 00189375
dc.relation.doi https://doi.org/10.1109/TEMC.2017.2666880
dc.bibliographicCitation.issue 4
dc.bibliographicCitation.volume 59
dc.bibliographicCitation.firstPage 1276
dc.bibliographicCitation.lastPage 1284
dc.description.version publishedVersion
tib.accessRights frei zug�nglich


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