dc.identifier.uri |
http://dx.doi.org/10.15488/1462 |
|
dc.identifier.uri |
http://www.repo.uni-hannover.de/handle/123456789/1487 |
|
dc.contributor.author |
Zelder, T.
|
|
dc.contributor.author |
Rabe, H.
|
|
dc.contributor.author |
Eul, H.
|
|
dc.date.accessioned |
2017-05-10T11:33:51Z |
|
dc.date.available |
2017-05-10T11:33:51Z |
|
dc.date.issued |
2007 |
|
dc.identifier.citation |
Zelder, T.; Rabe, H.; Eul, H.: Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters. In: Advances in Radio Science 5 (2007), S. 427-434. DOI: https://doi.org/10.5194/ars-5-427-2007 |
|
dc.description.abstract |
In this paper, a contactless measuring system for the determination of the S-parameters of planar circuits is presented. With a contactless measuring system it is possible to characterise a device-under-test (DUT) embedded in a planar circuit environment without cutting the planar transmission lines connecting the DUT. The technique utilizes four identical capacitive probes in conjunction with a vector network analyser (VNA). For the usage of electromagnetic probes compared to other coupling techniques like the electro-optic probing, there is no need for expensive and complex equipment in addition to the typical equipment of a common microwave laboratory. The S-parameters are determined accurately using conventional calibration methods. A simple analytical model for the representation of the basic characteristics is developed. Furthermore, the influences on the S-parameters as a result of a variation in the coupling are presented. With the knowledge of the system characteristics, an accurate contactless measurement system is set up. The comparison between conventional and contactless measurements in a frequency range of 1-20 GHz shows a very good agreement with a phase error smaller than 1°. |
eng |
dc.language.iso |
eng |
|
dc.publisher |
Göttingen : Copernicus GmbH |
|
dc.relation.ispartofseries |
Advances in Radio Science 5 (2007) |
|
dc.rights |
CC BY-NC-SA 2.5 Unported |
|
dc.rights.uri |
https://creativecommons.org/licenses/by-nc-sa/2.5/ |
|
dc.subject |
Basic characteristics |
eng |
dc.subject |
Calibration algorithm |
eng |
dc.subject |
Contactless measurement |
eng |
dc.subject |
Contactless measurement system |
eng |
dc.subject |
Electro-optic probing |
eng |
dc.subject |
Electromagnetic probes |
eng |
dc.subject |
Planar transmission lines |
eng |
dc.subject |
System characteristics |
eng |
dc.subject |
Calibration |
eng |
dc.subject |
Design for testability |
eng |
dc.subject |
Electric network analyzers |
eng |
dc.subject |
Electromagnetism |
eng |
dc.subject |
Probes |
eng |
dc.subject |
Scattering parameters |
eng |
dc.subject |
Measurements |
eng |
dc.subject.ddc |
621,3 | Elektrotechnik, Elektronik
|
ger |
dc.title |
Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters |
eng |
dc.type |
Article |
|
dc.type |
Text |
|
dc.relation.issn |
1684-9965 |
|
dc.relation.doi |
https://doi.org/10.5194/ars-5-427-2007 |
|
dc.bibliographicCitation.volume |
5 |
|
dc.bibliographicCitation.firstPage |
427 |
|
dc.bibliographicCitation.lastPage |
434 |
|
dc.description.version |
publishedVersion |
|
tib.accessRights |
frei zug�nglich |
|