Schinke, C.; Hinken, D.; Bothe, K.; Ulzhöfer, C.; Milsted, A. et al.: Determination of the collection diffusion length by electroluminescence imaging. In: Energy Procedia 8 (2011), S. 147-152. DOI:
https://doi.org/10.1016/j.egypro.2011.06.116
Abstract: |
The electroluminescence emission of crystalline silicon solar cells at near-bandgap wavelengths is investigated. We show that the intensity of the emitted luminescence at near-bandgap wavelengths is directly proportional to the collection diffusion length Lc which is a measure of bulk and rear surface recombination properties and determines the short circuit current of a solar cell illuminated with light of near-bandgap wavelengths. We provide experimental evidence for the determination of Lc by carrying out electroluminescence measurements on a set of 15 specially prepared monocrystalline silicon solar cells with different thicknesses. Moreover, we demonstrate and discuss the applicability of the proposed method to obtain images of the collection diffusion length Lc of multicrystalline silicon solar cells. The values determined by electroluminescence imaging coincide with values obtained from spectrally resolved quantum efficiency measurements with a relative accuracy of 13 %.
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License of this version: |
CC BY-NC-ND 3.0 Unported - https://creativecommons.org/licenses/by-nc-nd/3.0/
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Publication type: |
Article |
Publishing status: |
publishedVersion |
Publication date: |
2011 |
Keywords english: |
Collection diffusion length, Electroluminescence imaging, Crystalline silicon solar cells, Diffusion length, Electroluminescence emission, Electroluminescence imaging, Experimental evidence, Multi-crystalline silicon solar cells, Quantum Efficiency measurements, Rear surfaces, Relative accuracy, Crystalline materials, Diffusion, Electroluminescence, Energy gap, Monocrystalline silicon, Photovoltaic effects, Polysilicon, Silicon solar cells, Light
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DDC: |
530 | Physik
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Controlled keywords(GND): |
Konferenzschrift
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