dc.identifier.uri |
http://dx.doi.org/10.15488/999 |
|
dc.identifier.uri |
http://www.repo.uni-hannover.de/handle/123456789/1023 |
|
dc.contributor.author |
Holst, Hendrik
|
|
dc.contributor.author |
Winter, Matthias
|
|
dc.contributor.author |
Vogt, Malte R.
|
|
dc.contributor.author |
Bothe, Karsten
|
|
dc.contributor.author |
Köntges, Marc
|
|
dc.contributor.author |
Brendel, Rolf
|
|
dc.contributor.author |
Altermatt, Pietro P.
|
|
dc.date.accessioned |
2016-12-22T11:22:41Z |
|
dc.date.available |
2016-12-22T11:22:41Z |
|
dc.date.issued |
2013 |
|
dc.identifier.citation |
Holst, H.; Winter, M.; Vogt, M.R.; Bothe, K.; Köntges, M. et al.: Application of a new ray tracing framework to the analysis of extended regions in Si solar cell modules. In: Energy Procedia 38 (2013), S. 86-93. DOI: https://doi.org/10.1016/j.egypro.2013.07.253 |
|
dc.description.abstract |
While ray tracing of solar cells was established decades ago, ray tracing of entire modules has met obstacles, mainly because module optics are affected by geometric structures varying over a large scale of dimensions. In this paper, we introduce a ray tracing framework that is based on a modular structure made up of separate plugins. While existing plugins can be used for common effects such as light sources, absorption in materials, etc., specialized plug-ins can be written by users to handle problem-specific properties. We demonstrate the functionality of our approach by ray tracing a test module containing 9 crystalline Si solar cells. Good agreement between light-beam induced current (LBIC) measurements and ray tracing is achieved. |
eng |
dc.language.iso |
eng |
|
dc.publisher |
Amsterdam : Elsevier |
|
dc.relation.ispartofseries |
Energy Procedia 38 (2013) |
|
dc.rights |
CC BY-NC-ND 3.0 Unported |
|
dc.rights.uri |
https://creativecommons.org/licenses/by-nc-nd/3.0/ |
|
dc.subject |
LBIC |
eng |
dc.subject |
Module |
eng |
dc.subject |
Ray tracing |
eng |
dc.subject.classification |
Konferenzschrift |
ger |
dc.subject.ddc |
600 | Technik
|
ger |
dc.subject.ddc |
620 | Ingenieurwissenschaften und Maschinenbau
|
ger |
dc.subject.ddc |
530 | Physik
|
ger |
dc.title |
Application of a new ray tracing framework to the analysis of extended regions in Si solar cell modules |
eng |
dc.type |
Article |
|
dc.type |
Text |
|
dc.relation.issn |
18766102 |
|
dc.relation.doi |
https://doi.org/10.1016/j.egypro.2013.07.253 |
|
dc.bibliographicCitation.volume |
38 |
|
dc.bibliographicCitation.firstPage |
86 |
|
dc.bibliographicCitation.lastPage |
93 |
|
dc.description.version |
publishedVersion |
|
tib.accessRights |
frei zug�nglich |
|