Abriel, Walter
(Berlin : De Gruyter, 1987)
Using 293 K diffractometer intensity data, the crystal structures of (NH4)2SeBr6 (1) and [H3N(CH2)3NH3]SeBr6 (2) have been determined by single crystal X-ray technique and refined to a final Rw of 0.049 and 0.040, respectively. ...